Colloquium: Dr. Mehmet Z. Baykara | University of California Merced
In-Person PHYS 401
Location
Physics : 401
Date & Time
October 2, 2024, 11:00 am – 12:00 pm
Description
TITLE: "Atomic-Resolution Surface Imaging under Ambient Conditions via Conductive Atomic Force Microscopy”
ABSTRACT: Atomic-scale characteristics of surfaces play a key role in condensed matter physics. Yet, conventional tools utilized to characterize surfaces with atomic resolution rely on strict environmental conditions such as ultrahigh vacuum. Here, we report true atomic-resolution imaging via conductive atomic force microscopy (C-AFM) under ambient conditions [1]. Our approach delivers atomic-resolution maps on a variety of material surfaces that comprise defects including single atomic vacancies. Moreover, we report the capability of in situ charge state manipulation of defects on MoS 2 , and the observation of an exotic electronic effect: room- temperature charge ordering in a thin transition metal carbide (TMC) crystal (i.e., an MXene), α- Mo 2 C. Our findings herald the emergence of C-AFM as a powerful tool for atomic-resolution imaging and manipulation of surface structure and electronics under ambient conditions.
ABSTRACT: Atomic-scale characteristics of surfaces play a key role in condensed matter physics. Yet, conventional tools utilized to characterize surfaces with atomic resolution rely on strict environmental conditions such as ultrahigh vacuum. Here, we report true atomic-resolution imaging via conductive atomic force microscopy (C-AFM) under ambient conditions [1]. Our approach delivers atomic-resolution maps on a variety of material surfaces that comprise defects including single atomic vacancies. Moreover, we report the capability of in situ charge state manipulation of defects on MoS 2 , and the observation of an exotic electronic effect: room- temperature charge ordering in a thin transition metal carbide (TMC) crystal (i.e., an MXene), α- Mo 2 C. Our findings herald the emergence of C-AFM as a powerful tool for atomic-resolution imaging and manipulation of surface structure and electronics under ambient conditions.
